A Note on Fault Testing for Reversible Circuits

Publication Information

Title

Japanese:
English:	A Note on Fault Testing for Reversible Circuits

Author

Japanese:	田湯智, 上野修一.
English:	Satoshi Tayu, Shuichi UENO.

Language

English

Journal/Book name

Japanese:
English:	Proceedings of the 2010 IEICE General Conference

Volume, Number, Page

No. A-1-32

Published date

Mar. 2010

Publisher

Japanese:
English:	Institute of Electronics, Information and Communication Engineers

Conference name

Japanese:
English:	2010 IEICE General Conference

Conference site

Japanese:
English:	Tohoku Univ.