Universal Test Sets for Reversible Circuits

Publication Information

Title

Japanese:
English:	Universal Test Sets for Reversible Circuits

Author

Japanese:	田湯智, Shota Fukuyama, 上野修一.
English:	Satoshi Tayu, Shota Fukuyama, Shuichi UENO.

Language

English

Journal/Book name

Japanese:
English:	Springer Verlarg, Lecture Notes in Computer Science

Volume, Number, Page

Vol. 6196 pp. 348-357

Published date

July 2010

Publisher

Japanese:
English:

Conference name

Japanese:
English:	International Computing and Combinatorics Conference

Conference site

Japanese:
English:	Nha Trang, Vietnam

Official URL

DOI