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Title
Japanese: 
English:Effect of Remote-Surface –Roughness Scattering on Electron Mobility in MOSFETs with High-k Dielectrics 
Author
Japanese: M. Mamatrishat, 幸田みゆき, 川那子高暢, 角嶋邦之, パールハットアヘメト, A. Aierken, 筒井一生, 西山彰, 杉井信之, 名取研二, 岩井洋.  
English: M. Mamatrishat, Miyuki Kouda, Takamasa Kawanago, Kuniyuki KAKUSHIMA, Ahmet Parhat, A. Aierken, KAZUO TSUTSUI, 西山彰, Nobuyuki Sugii, KENJI NATORI, HIROSHI IWAI.  
Language English 
Journal/Book name
Japanese: 
English: 
Volume, Number, Page        
Published date Oct. 2010 
Publisher
Japanese: 
English: 
Conference name
Japanese: 
English:ECS 218th Meeting 
Conference site
Japanese: 
English:Las Vegas, USA 

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