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Publication Information
Title
Japanese:
English:
Effect of Remote-Surface –Roughness Scattering on Electron Mobility in MOSFETs with High-k Dielectrics
Author
Japanese:
M. Mamatrishat
,
幸田みゆき
,
川那子高暢
,
角嶋邦之
,
パールハットアヘメト
,
A. Aierken
,
筒井一生
,
西山彰
,
杉井信之
,
名取研二
,
岩井洋
.
English:
M. Mamatrishat
,
Miyuki Kouda
,
Takamasa Kawanago
,
Kuniyuki KAKUSHIMA
,
Ahmet Parhat
,
A. Aierken
,
KAZUO TSUTSUI
,
西山彰
,
Nobuyuki Sugii
,
KENJI NATORI
,
HIROSHI IWAI
.
Language
English
Journal/Book name
Japanese:
English:
Volume, Number, Page
Published date
Oct. 2010
Publisher
Japanese:
English:
Conference name
Japanese:
English:
ECS 218th Meeting
Conference site
Japanese:
English:
Las Vegas, USA
©2007
Tokyo Institute of Technology All rights reserved.