Fabrication and Characterization of a Ferroelectric-Gate FET with a ITO/PZT/SRO/Pt Stacked Structure”, ,

Publication Information

Title

Japanese:
English:	Fabrication and Characterization of a Ferroelectric-Gate FET with a ITO/PZT/SRO/Pt Stacked Structure”, ,

Author

Japanese:	Phan Tue, Bui Trinh, 宮迫毅明, 徳光永輔, 下田達也.
English:	Phan Tue, Bui Trinh, Takaaki Miyasako, Eisuke Tokumitsu, Tatsuya Shimoda.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Dec. 2010

Publisher

Japanese:
English:

Conference name

Japanese:
English:	22nd International Conference on Microelectronics (ICM 2010)

Conference site

Japanese:
English:	Cairo