Interconnect challenges in nano CMOS circuit

Publication Information

Title

Japanese:
English:	Interconnect challenges in nano CMOS circuit

Author

Japanese:	益一哉, 天川修平, 石原昇.
English:	Kazuya Masu, Shuhei Amakawa, Noboru Ishihara.

Language

English

Journal/Book name

Japanese:
English:	International Symposium on Technology Evolution for Silicon Nano-Slectronics (ISTESNE)

Volume, Number, Page

pp. 28

Published date

June 2010

Publisher

Japanese:
English:	International Symposium on Technology Evolution for Silicon Nano-Slectronics (ISTESNE)

Conference name

Japanese:
English:	International Symposium on Technology Evolution for Silicon Nano-Slectronics (ISTESNE)

Conference site

Japanese:
English:	Tokyo, Japan