デバイスモデルを用いた並列接続pinダイオードのリカバリー特性解析

Publication Information

Title

Japanese:	デバイスモデルを用いた並列接続pinダイオードのリカバリー特性解析
English:	Analysis of Reverse-Recovery Characteristics of Parallel-Connected pin Diodes Using a Physics-Based Device Model

Author

Japanese:	杉本貴之, 冨永真志, 漆畑廣明, 藤田英明, 赤木泰文, 木ノ内伸一, 大井健史.
English:	Takayuki Sugimoto, Shinji Tominaga, Hiroaki Urushibata, Hideaki Fujita, Hirofumi Akagi, Shinichi Kinouchi, Takeshi Oi.

Language

Japanese

Journal/Book name

Japanese:	電気学会産業応用部門大会
English:	IEEJ Japan Industry Application Society Conference

Volume, Number, Page

Vol. 1 pp. 375-376

Published date

Aug. 2010

Publisher

Japanese:	電気学会
English:	Institute of Electrical Engineering in Japan

Conference name

Japanese:	産業応用部門大会
English:	Industry Application Society Conference

Conference site

Japanese:	芝浦工業大学
English:	Shibaura Institute of Technology