Interface and bulk effects for bias-light-illumination instability in amorphous-In-Ga-Zn-O thin-film transistors

Publication Information

Title

Japanese:
English:	Interface and bulk effects for bias-light-illumination instability in amorphous-In-Ga-Zn-O thin-film transistors

Author

Japanese:	野村研二, 神谷利夫, 細野秀雄.
English:	Kenji Nomura, Toshio Kamiya, Hideo Hosono.

Language

English

Journal/Book name

Japanese:
English:	J. Soc. Inf. Display

Volume, Number, Page

vol. 18 p. 789

Published date

2010

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: