A thru-only de-embedding method for on-wafer characterization of multiport networks

Publication Information

Title

Japanese:
English:	A thru-only de-embedding method for on-wafer characterization of multiport networks

Author

Japanese:	天川修平, 石原昇, 益一哉.
English:	Shuhei Amakawa, Noboru Ishihara, Kazuya Masu.

Language

English

Journal/Book name

Japanese:
English:	Advanced Microwave Circuits and Systems

Volume, Number, Page

pp. 13-32

Published date

Apr. 2010

Publisher

Japanese:
English:	InTech

Conference name

Japanese:
English:

Conference site

Japanese:
English:

File