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Title
Japanese:チャージセンサによるシリコン量子ドットの少数電子状態観測 
English: 
Author
Japanese: 堀部浩介, 小寺哲夫, 蒲原知宏, 内田 建, 小田俊理.  
English: kousuke Horibe, Tetsuo Kodera, Tomohiro Kambara, Ken Uchida, SHUNRI ODA.  
Language Japanese 
Journal/Book name
Japanese: 
English: 
Volume, Number, Page        
Published date Mar. 2011 
Publisher
Japanese: 
English: 
Conference name
Japanese:第58回応用物理学関係連合講演会 
English: 
Conference site
Japanese:厚木市 
English: 

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