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Title
Japanese: 
English:Reduction of Base-Collector Capacitance in InP/InGaAs DHBT with Buried SiO2 Wires 
Author
Japanese: 武部 直明, 宮本 恭幸.  
English: N. Takebe, Y. Miyamoto.  
Language English 
Journal/Book name
Japanese: 
English: 
Volume, Number, Page        
Published date Sept. 14, 2011 
Publisher
Japanese: 
English: 
Conference name
Japanese: 
English:2011 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices(AWAD) 
Conference site
Japanese: 
English:Daejeon 
Official URL http://astl.hongik.ac.kr/awad2011/home.html
 

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