Charge detection techniques in Si double quantum dots

Publication Information

Title

Japanese:
English:	Charge detection techniques in Si double quantum dots

Author

Japanese:	蒲原知宏, 小寺哲夫, Thierry Ferrus, Alessandro Rossi, 堀部浩介, Yasuhiko Arakawa, David Williams, 小田俊理.
English:	Tomohiro Kambara, Tetsuo Kodera, Thierry Ferrus, Alessandro Rossi, kousuke Horibe, Yasuhiko Arakawa, David Williams, Shunri Oda.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

P-5

Published date

Oct. 2011

Publisher

Japanese:
English:

Conference name

Japanese:
English:	G-COE PICE International Symposium and IEEE EDS Minicolloquium on Advanced Hybrid Nano Devices: Prospects by World’s Leading Scientists

Conference site

Japanese:	Tokyo
English: