Structural relaxation in amorphous oxide semiconductor

Publication Information

Title

Japanese:
English:	Structural relaxation in amorphous oxide semiconductor

Author

Japanese:	井手啓介, 野村研二, 平松秀典, 神谷利夫, 細野秀雄.
English:	Keisuke Ide, Kenji Nomura, Hidenori Hiramatsu, Toshio Kamiya, Hideo Hosono.

Language

English

Journal/Book name

Japanese:
English:	J. Appl. Phys

Volume, Number, Page

Vol. 111 No. 073513 pp. 1 - 6

Published date

2012

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: