高精度MOSFETモデルを用いた損失・ノイズ評価への基礎的検討

Publication Information

Title

Japanese:	高精度MOSFETモデルを用いた損失・ノイズ評価への基礎的検討
English:	Investigation of noise and switching-energy loss by using a precise MOSFET model

Author

Japanese:	岩田恭彰, 冨永真志, 藤田英明, 赤木泰文, 堀口剛司, 木ノ内伸一, 大井健史, 漆畑廣明.
English:	Yasuaki Iwata, Shinji Tominaga, Hideaki Fujita, Hirofumi Akagi, 堀口剛司, 木ノ内伸一, 大井健史, hiroaki urushibata.

Language

Japanese

Journal/Book name

Japanese:	電気学会産業応用部門大会
English:	IEEJ Japan Industry Application Society Conference

Volume, Number, Page

Vol. 1 no. 1-135 pp. 615-618

Published date

Sept. 8, 2011

Publisher

Japanese:	電気学会
English:	Institute of Electrical Engineering in Japan

Conference name

Japanese:	産業応用部門大会
English:	Industry Application Society Conference

Conference site

Japanese:	琉球大学
English:	Shibaura Institute of Technology