Band alignment of InGaZnO<sub>4</sub>/Si interface by hard x-ray photoelectron spectroscopy

Publication Information

Title

Japanese:
English:	Band alignment of InGaZnO₄/Si interface by hard x-ray photoelectron spectroscopy

Author

Japanese:	Kyeongmi Lee, Eiji Ikenaga, Takeharu Sugiyama, Keisuke Kobayashi, Kyeongmi Lee, 野村研二, 柳博, 神谷利夫, Eiji Ikenaga, Takeharu Sugiyama, Keisuke Kobayashi, 細野秀雄.
English:	Kyeongmi Lee, Eiji Ikenaga, Takeharu Sugiyama, Keisuke Kobayashi, Kyeongmi Lee, Kenji Nomura, Hiroshi Yanagi, Toshio Kamiya, Eiji Ikenaga, Takeharu Sugiyama, Keisuke Kobayashi, Hideo Hosono.

Language

English

Journal/Book name

Japanese:
English:	J. Appl. Phys

Volume, Number, Page

Vol. 112, pp. 033713-1 - 6

Published date

2012

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: