Analysis of the Hysteresis Behavior in Poly-Si TFTs Using On-the-Fly Measurement | Tokyo Tech Research Repository (T2R2)

Publication Information

Title

Japanese:
English:	Analysis of the Hysteresis Behavior in Poly-Si TFTs Using On-the-Fly Measurement

Author

Japanese:	波多野睦子.
English:	Mutsuko Hatano.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

E13-2272

Published date

2008

Publisher

Japanese:
English:

Conference name

Japanese:
English:	214th Electrochem. Soc. Meeting

Conference site

Japanese:
English:	Honolulu

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