Accelerated Negative-Bias Temperature Degradation in Low-Temperature Polycrystalline-Silicon p-Channel TFTs Under Dynamic Stress

Publication Information

Title

Japanese:
English:	Accelerated Negative-Bias Temperature Degradation in Low-Temperature Polycrystalline-Silicon p-Channel TFTs Under Dynamic Stress

Author

Japanese:	波多野睦子.
English:	Mutsuko Hatano.

Language

English

Journal/Book name

Japanese:
English:	IEEE transactions on Electron Devices

Volume, Number, Page

54 2452-2459

Published date

2007

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: