Analysis of the Hysteresis Behavior in Poly-Si TFTs Using On-the-Fly Measurement | Tokyo Tech Research Repository (T2R2)

Publication Information

Title

Japanese:
English:	Analysis of the Hysteresis Behavior in Poly-Si TFTs Using On-the-Fly Measurement

Author

Japanese:	波多野睦子.
English:	Mutsuko Hatano.

Language

English

Journal/Book name

Japanese:
English:	ECS transactions

Volume, Number, Page

16 103-108

Published date

2008

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

©2007 Tokyo Institute of Technology All rights reserved.