Application of the maximum-entropy method to the calculation of electron densities of the Si(111) 7×7 surface from x-ray diffraction data | Tokyo Tech Research Repository (T2R2)

Publication Information

Title

Japanese:
English:	Application of the maximum-entropy method to the calculation of electron densities of the Si(111) 7×7 surface from x-ray diffraction data

Author

Japanese:	坂田修身.
English:	OSAMI SAKATA.

Language

English

Journal/Book name

Japanese:
English:	Report RLEMTIT

Volume, Number, Page

No. 20 pp. 53

Published date

1995

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

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