Thickness Dependence of Dielectric Properties in Bismuth Layer-structured Dielectrics

Publication Information

Title

Japanese:
English:	Thickness Dependence of Dielectric Properties in Bismuth Layer-structured Dielectrics

Author

Japanese:	Kenji Takahashi, Muneyasu Suzuki, Takashi Kojima, Takayuki Watanabe, Yukio Sakashita, Kazumi Kato, 坂田修身, Kazushi Sumitani, 舟窪浩.
English:	Kenji Takahashi, Muneyasu Suzuki, Takashi Kojima, Takayuki Watanabe, Yukio Sakashita, Kazumi Kato, OSAMI SAKATA, Kazushi Sumitani, Hiroshi Funakubo.

Language

English

Journal/Book name

Japanese:
English:	Appl. Phys. Lett.

Volume, Number, Page

Vol. 89 082901-1-3.

Published date

2006

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI