Structural analysis of NiO ultra-thin films epitaxially grown on ultra-wmooth sapphire substrates by synchrotron X-ray diffraction measurements

Publication Information

Title

Japanese:
English:	Structural analysis of NiO ultra-thin films epitaxially grown on ultra-wmooth sapphire substrates by synchrotron X-ray diffraction measurements

Author

Japanese:	坂田修身, Min-Su Yi, 松田晃史, 劉進, 佐藤周平, 秋葉周作, 佐々木敦.
English:	OSAMI SAKATA, Min-Su Yi, Akifumi Matsuda, Jin Liu, Shuhei Sato, Shusaku Akiba, Atsushi Sasaki.

Language

English

Journal/Book name

Japanese:
English:	Applied Surface Science

Volume, Number, Page

Vol. 221 450-454

Published date

Jan. 2004

Publisher

Japanese:	Elsevier
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: