Thermal-Aware Device Design of Nanoscale Bulk/SOI FinFETs: Suppression of Operation Temperature and Its Variability

Publication Information

Title

Japanese:
English:	Thermal-Aware Device Design of Nanoscale Bulk/SOI FinFETs: Suppression of Operation Temperature and Its Variability

Author

Japanese:	高橋綱己, 別府伸耕, K. Chen, 小田俊理, 内田建.
English:	T. Takahashi, N. Beppu, K. Chen, S. Oda, K. Uchida.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

pp. 809-812

Published date

2011

Publisher

Japanese:
English:

Conference name

Japanese:
English:	IEDM 2011

Conference site

Japanese:
English:	Washington DC