シリコン量子ドットを用いた電荷検出

Publication Information

Title

Japanese:	シリコン量子ドットを用いた電荷検出
English:

Author

Japanese:	小寺哲夫, 堀部浩介, 林文城, 蒲原知宏, T. Ferrus, A. Rossi, 内田建, D. A. Williams, 荒川泰彦, 小田俊理.
English:	Tetsuo Kodera, kousuke Horibe, Wencheng Lin, Tomohiro Kambara, T Ferrus, A. Rossi, Ken Uchida, David A. Williams, Yasuhiko Arakawa, SHUNRI ODA.

Language

Japanese

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Mar. 2012

Publisher

Japanese:
English:

Conference name

Japanese:	日本物理学会2012年年次大会
English:

Conference site

Japanese:
English: