Experimental Study on Electron Mobility in Accumulation-Mode Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistors

Publication Information

Title

Japanese:
English:	Experimental Study on Electron Mobility in Accumulation-Mode Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistors

Author

Japanese:	角谷直哉, 大橋輝之, 高橋綱己, 小田俊理, 内田建.
English:	N. Kadotani, T. Ohashi, T. Takahashi, S. Oda, K. Uchida.

Language

English

Journal/Book name

Japanese:
English:	Japanese Journal of Applied Physics

Volume, Number, Page

Vol. 50 pp. 094101 (7 pages)

Published date

Sept. 2011

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI