Charge noise characterization and reduction in Si/SiGe quantum devices

Publication Information

Title

Japanese:
English:	Charge noise characterization and reduction in Si/SiGe quantum devices

Author

Japanese:	K. Takeda, 福岡佑二, T. Obata, J. Sailer, A. Wild, 小寺哲夫, K. Sawano, 小田俊理, D. Bougeard, G. Abstreiter, S. Tarucha, Y Shiraki.
English:	K. Takeda, Y. Fukuoka, T. Obata, J. Sailer, A. Wild, T. Kodera, K. Sawano, S. Oda, D. Bougeard, G. Abstreiter, S. Tarucha, Y Shiraki.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Aug. 2, 2012

Publisher

Japanese:
English:

Conference name

Japanese:
English:	31st International Conference on the Physics of Semiconductor (ICPS2012)

Conference site

Japanese:
English:	Zurich