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Publication Information
Title
Japanese:
第25節 光学法、X線法によるアモルファスIGZO薄膜の構造・物性解析; 光学薄膜の最適設計・成膜技術と膜厚・膜質・光学特性の制御
English:
Author
Japanese:
神谷利夫
,
細野秀雄
.
English:
TOSHIO KAMIYA
,
HIDEO HOSONO
.
Language
Japanese
Journal/Book name
Japanese:
English:
Volume, Number, Page
pp. 367-376
Published date
2013
Publisher
Japanese:
English:
2013/6/28 株式会社 技術情報協会発行
Conference name
Japanese:
English:
Conference site
Japanese:
English:
©2007
Tokyo Institute of Technology All rights reserved.