Modeling of the Output Characteristics of Advanced N-MOSFETs After a Severe Gate-to-Channel Dielectric Breakdown

Publication Information

Title

Japanese:
English:	Modeling of the Output Characteristics of Advanced N-MOSFETs After a Severe Gate-to-Channel Dielectric Breakdown

Author

Japanese:	Miranda Enrique, 川那子高暢, 角嶋邦之, J. Sune, 岩井洋.
English:	Miranda Enrique, Takamasa Kawanago, Kuniyuki KAKUSHIMA, J. Sune, HIROSHI IWAI.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

2013

Publisher

Japanese:
English:

Conference name

Japanese:
English:	Insulating Films on Semiconductors(INFOS 2013)

Conference site

Japanese:
English:	Cracow