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Publication Information
Title
Japanese:
English:
Modeling of the output characteristics of advanced n-MOSFETs after a severe gate-to-channel dielectric breakdown
Author
Japanese:
Miranda Enrique
,
川那子高暢
,
角嶋邦之
,
J.Sune
,
岩井洋
.
English:
Miranda Enrique
,
Takamasa Kawanago
,
Kuniyuki KAKUSHIMA
,
J.Sune
,
HIROSHI IWAI
.
Language
English
Journal/Book name
Japanese:
English:
[Microelectronic Engineering
Volume, Number, Page
Vol. 109 pp. 322-325
Published date
Sept. 2013
Publisher
Japanese:
English:
Conference name
Japanese:
English:
Conference site
Japanese:
English:
DOI
https://doi.org/10.1016/j.mee.2013.03.030
©2007
Tokyo Institute of Technology All rights reserved.