Methodology for Evaluating Operation Temperatures of Fin-Type Field-Effect Transistors Connected by Interconnect Wires

Publication Information

Title

Japanese:
English:	Methodology for Evaluating Operation Temperatures of Fin-Type Field-Effect Transistors Connected by Interconnect Wires

Author

Japanese:	高橋綱己, 小田俊理, 内田建.
English:	Tsunaki Takahashi, Shunri Oda, Ken Uchida.

Language

English

Journal/Book name

Japanese:
English:	Japanese Journal of Applied Physics

Volume, Number, Page

Vol. 52 pp. 064203 (7 pages)

Published date

May 22, 2013

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI