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Publication Information
Title
Japanese:
English:
Improved algorithm for multiwavelength single-shot interferometric surface profiling:Speeding up the multiwavelength-integrated local model fitting method by local information sharing.
Author
Japanese:
仲田 圭佑
,
杉山 将
, Kitagawa, K., Otsuki, M..
English:
Nakata, K.
,
Sugiyama, M.
, Kitagawa, K., Otsuki, M..
Language
English
Journal/Book name
Japanese:
English:
Applied Optics
Volume, Number, Page
vol. 52 no. 17 pp. 4042-4053
Published date
2013
Publisher
Japanese:
English:
Conference name
Japanese:
English:
Conference site
Japanese:
English:
DOI
https://doi.org/10.1364/AO.52.004042
©2007
Tokyo Institute of Technology All rights reserved.