Direct measurement of the valley splitting in a few-electron silicon quantum dot using charge sensor source-drain bias spectroscopy

Publication Information

Title

Japanese:
English:	Direct measurement of the valley splitting in a few-electron silicon quantum dot using charge sensor source-drain bias spectroscopy

Author

Japanese:	堀部浩介, 小寺哲夫, 小田俊理.
English:	K. Horibe, T. Kodera, S. Oda.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

ThP65

Published date

July 2013

Publisher

Japanese:
English:

Conference name

Japanese:
English:	EP2DS-20/MSS-16

Conference site

Japanese:
English:	Wroclaw