シリコン／弗化物共鳴トンネル構造を用いた抵抗スイッチング素子の特性評価

Publication Information

Title

Japanese:	シリコン／弗化物共鳴トンネル構造を用いた抵抗スイッチング素子の特性評価
English:	Characterization of resistance switching devices using silicon / fluoride resonant tunneling structures

Author

Japanese:	平澤亮, 仲正路友康, 渡辺正裕.
English:	R. Hirasawa, Y. Nakasyouji, M. Watanabe.

Language

Japanese

Journal/Book name

Japanese:
English:

Volume, Number, Page

30a-ZB-5 3 1425

Published date

Mar. 30, 2009

Publisher

Japanese:
English:

Conference name

Japanese:	第56回応用物理学会関係連合講演会
English:	Nat. Conv. Rec. of the 56th Spring Meeting of The Jpn. Soc. of Appl. Phys

Conference site

Japanese:	筑波
English:	Tsukuba