エピタキシャルCaF<sub>2</sub>/Si量子ドット構造の光電流測定

Publication Information

Title

Japanese:	エピタキシャルCaF₂/Si量子ドット構造の光電流測定
English:	Photocurrent measurement of epitaxial CaF₂/Si quantum-dot structures

Author

Japanese:	大木洋, 渡辺正裕.
English:	H. Oogi, M. Watanabe.

Language

Japanese

Journal/Book name

Japanese:
English:

Volume, Number, Page

20a-TG-10 16-096

Published date

Mar. 20, 2010

Publisher

Japanese:
English:

Conference name

Japanese:	第57回応用物理学会関係連合講演会
English:	Nat. Conv. Rec. of the 57th Spring Meeting of The Jpn. Soc. of Appl. Phys

Conference site

Japanese:	湘南
English:	shonan