Transmission Electron Microscopy Analysis of CaF2/CdF2/CaF2 Resonant Tunneling Diode Structures grown on Si(100) Substrate

Publication Information

Title

Japanese:
English:	Transmission Electron Microscopy Analysis of CaF₂/CdF₂/CaF₂ Resonant Tunneling Diode Structures grown on Si(100) Substrate

Author

Japanese:	渡辺正裕, 金澤徹, 浅田雅洋.
English:	M. Watanabe, T. Kanazawa, M. Asada.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Vol. TuD P8 pp. 222

Published date

Oct. 2007

Publisher

Japanese:
English:

Conference name

Japanese:
English:	The 34th International Symposium on Compound Semiconductors (ISCS2007)

Conference site

Japanese:
English:	Kyoto, Japan