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Publication Information
Title
Japanese:
English:
Interface reaction analysis of La2O3/SiC upon annealing by ATR-FTIR
Author
Japanese:
雷 一鳴
,
宗清修
,
角嶋邦之
,
川那子高暢
,
片岡好則
,
西山彰
,
杉井信之
,
若林整
,
筒井一生
,
名取研二
,
岩井洋
,
M. Furuhashi
,
N. Miura
,
S. Yamakawa
.
English:
雷 一鳴
,
Shu Munekiyo
,
Kuniyuki KAKUSHIMA
,
Takamasa Kawanago
,
Yoshinori Kataoka
,
Akira Nishiyama
,
Nobuyuki Sugii
,
Hitoshi Wakabayashi
,
KAZUO TSUTSUI
,
Kenji Natori
,
HIROSHI IWAI
,
M. Furuhashi
,
N. Miura
,
S. Yamakawa
.
Language
English
Journal/Book name
Japanese:
English:
Volume, Number, Page
Published date
2014
Publisher
Japanese:
English:
Conference name
Japanese:
English:
The Workshop on Future Trend of Nanoelectronics:WIMNACT 39, February 7, 2014, Suzukake Hall, Suzukakedai Campus, Tokyo Institute of Technology, Japan
Conference site
Japanese:
English:
©2007
Tokyo Institute of Technology All rights reserved.