Light Irradiation and Applied Voltage History Sensors Using Amorphous In-Ga-Zn-O Thin- Film Transistors Exposed to Ozone Annealing and Fabricated under High Oxygen Pressure
Author
Japanese:
M. Kimura,
T. Hasegawa,
T. Matsuda,
K. Ide,
野村 研二,
神谷 利夫,
細野 秀雄.