Positive Gate Bias Instability Induced by Diffusion of Neutral Hydrogen in Amorphous In–Ga–Zn–O Thin-Film Transistor

Publication Information

Title

Japanese:
English:	Positive Gate Bias Instability Induced by Diffusion of Neutral Hydrogen in Amorphous In–Ga–Zn–O Thin-Film Transistor

Author

Japanese:	Kay Domen, 宮瀬貴也, 安部勝美, 細野秀雄, 神谷利夫.
English:	Kay Domen, Takaya Miyase, Katsumi Abe, Hideo Hosono, Toshio Kamiya.

Language

English

Journal/Book name

Japanese:
English:	IEEE Electron Dev. Lett.

Volume, Number, Page

Vol. 35 pp. 832-834

Published date

2014

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: