Characterization of Crossing Transmission Line Using Two-Port Measurements for Millimeter-Wave CMOS Circuit Design

Publication Information

Title

Japanese:
English:	Characterization of Crossing Transmission Line Using Two-Port Measurements for Millimeter-Wave CMOS Circuit Design

Author

Japanese:	Tokgoz KorkutKaan, LIM KIMSRUN, 河合誠太郎, NURUL FAJRI, 岡田健一, 松澤昭.
English:	Korkut Kaan Tokgoz, Kimsrun Lim, Seitaro Kawai, Nurul Fajri, Kenichi Okada, Akira Matsuzawa.

Language

English

Journal/Book name

Japanese:
English:	IEICE Transactions on Electronics

Volume, Number, Page

Vol. E98-C No. 1 pp. 35-44

Published date

Jan. 2015

Publisher

Japanese:
English:	IEICE

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI