Comparative study of power-gating architectures for nonvolatile FinFET-SRAM using spintronics-based retention technology

Publication Information

Title

Japanese:
English:	Comparative study of power-gating architectures for nonvolatile FinFET-SRAM using spintronics-based retention technology

Author

Japanese:	周藤悠介, 山本修一郎, 菅原聡.
English:	Yusuke Shuto, Shuu'ichirou Yamamoto, Satoshi Sugahara.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Mar. 2015

Publisher

Japanese:
English:

Conference name

Japanese:
English:	18th Design, Automation and Test in Europe (DATE15)

Conference site

Japanese:
English:	Grenoble