Optimal Probe and Statistical Testing in Weak-Value Amplification | Tokyo Tech Research Repository (T2R2)

Publication Information

Title

Japanese:	弱値増幅における最適プローブと統計的検定
English:	Optimal Probe and Statistical Testing in Weak-Value Amplification

Author

Japanese:	須佐友紀.
English:	Yuki Susa.

Type

Type:	Thesis (Ph.D.) Summary
Country:	Japan

Language

English

Organization name

Tokyo Institute of Technology

Report number

甲第10052号

Conferred date

2016/03/26

Judge

File

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