Measurement of charge states in Si/SiGe multiple quantum dots

Publication Information

Title

Japanese:
English:	Measurement of charge states in Si/SiGe multiple quantum dots

Author

Japanese:	Tomohiro Otsuka, 武田健太, Jun Yoneda, 本田拓夢, Matthieu R. Delbecq, Giles Allison, Marian Marx, 中島貴史, 小寺哲夫, 小田俊理, Yusuke Hoshi, Noritaka Usami, Kohei M. Itoh, 樽茶清悟.
English:	Tomohiro Otsuka, Kenta Takeda, Jun Yoneda, Takumu Honda, Matthieu R. Delbecq, Giles Allison, Marian Marx, Takashi Nakajima, Tetsuo Kodera, Shunri Oda, Yusuke Hoshi, Noritaka Usami, Kohei M. Itoh, Seigo Tarucha.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

June 2016

Publisher

Japanese:
English:

Conference name

Japanese:
English:	Silicon Quantum Electronics Workshop 2016

Conference site

Japanese:
English:	Delft