Measurement of the SiO2/SiC interface state density in a wide energy-level range using capacitance transient spectroscopy

Publication Information

Title

Japanese:
English:	Measurement of the SiO2/SiC interface state density in a wide energy-level range using capacitance transient spectroscopy

Author

Japanese:	長谷川淳一, 岩崎孝之, 小寺哲夫, 波多野睦子.
English:	J. Hasegawa, T. Iwasaki, T. Kodera, M. Hatano.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Dec. 10, 2015

Publisher

Japanese:
English:

Conference name

Japanese:
English:	The Fourth International Education Forum on Environment and Energy Science(ACEEES)

Conference site

Japanese:
English:	Ka’anapali Maui Hawaii