Measurement of Dielectric Property in Terahertz Region Using Far-Infrared Ellipsometer

Publication Information

Title

Japanese:
English:	Measurement of Dielectric Property in Terahertz Region Using Far-Infrared Ellipsometer

Author

Japanese:	保科拓也, 金原一樹, 武田博明, 鶴見敬章.
English:	Takuya Hoshina, Kazuki Kanehara, Hiroaki Takeda, Takaaki Tsurumi.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

May 16, 2016

Publisher

Japanese:
English:

Conference name

Japanese:
English:	EMN Meeting on Terahertz 2016

Conference site

Japanese:
English:	San Sebastian