Atomic disorder of Li<sub>0.5</sub>Ni<sub>0.5</sub>O thin films caused by Li doping: estimation from X-ray Debye-Waller factors

Publication Information

Title

Japanese:
English:	Atomic disorder of Li_0.5Ni_0.5O thin films caused by Li doping: estimation from X-ray Debye-Waller factors

Author

Japanese:	Anli Yang, 坂田修身, 山内涼輔, LOKU SINGGAPPULIGE, Rosantha Kumara, Chulho Song, 勝矢良雄, 松田晃史, 吉本護.
English:	Anli Yang, Osami Sakata, Ryosuke Yamauchi, LOKU SINGGAPPULIGE, Rosantha Kumara, Chulho Song, Yoshio Katsuya, Akifumi Matsuda, Mamoru Yoshimoto.

Language

English

Journal/Book name

Japanese:
English:	Journal of Applied Crystallography

Volume, Number, Page

Volume 48 # 6 Page 1896-1900

Published date

Dec. 2015

Publisher

Japanese:
English:	International Union of Crystallography

Conference name

Japanese:
English:

Conference site

Japanese:
English:

Official URL

DOI