High-resolution total-cross-section measurements for electron scattering from Ar, Kr, and Xe employing a threshold-photoelectron source

Publication Information

Title

Japanese:	High-resolution total-cross-section measurements for electron scattering from Ar, Kr, and Xe employing a threshold-photoelectron source
English:	High-resolution total-cross-section measurements for electron scattering from Ar, Kr, and Xe employing a threshold-photoelectron source

Author

Japanese:	黒川学, 北島昌史, 豊島海士, 木住野貴也, 小田切丈, Kato, H., Hoshino, M., Tanaka, H., Ito, K..
English:	Manabu Kurokawa, Masashi KITAJIMA, Kaiji Toyoshima, Takaya Kishino, Takeshi Odagiri, Kato, H., Hoshino, M., Tanaka, H., Ito, K..

Language

English

Journal/Book name

Japanese:	Physical Review a
English:	Physical Review a

Volume, Number, Page

Vol. 84 No. 6 pp. 062717-1-13

Published date

Dec. 29, 2011

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI