Phase Identification of Ca-Si Films prepared on (001) Al2O3 Substrates Using X-ray Diffraction Wide Area Reciprocal Space Mapping Method

Publication Information

Title

Japanese:
English:	Phase Identification of Ca-Si Films prepared on (001) Al2O3 Substrates Using X-ray Diffraction Wide Area Reciprocal Space Mapping Method

Author

Japanese:	上原睦雄, 秋山賢輔, 松島正明, 清水荘雄, 内田寛, 木村好里, 舟窪浩.
English:	M. Uehara, K. Akiyama, M. Matsushima, T. Shimizu, H. Uchida, Y. Kimura, H. Funakubo.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

July 16, 2015

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:	Tsukuba