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Title
Japanese: 
English:Evaluation and Modeling of Adhesion Layer in Shock-Protection Structure for MEMS Accelerometer 
Author
Japanese: 山根 大輔, 小西 敏文, 佐布 晃昭, 年吉 洋, 曽根 正人, 益 一哉, 町田 克之.  
English: Daisuke Yamane, Toshifumi Konishi, Teruaki Safu, Hiroshi Toshiyoshi, Masato Sone, Kazuya Masu, Katsuyuki Machida.  
Language English 
Journal/Book name
Japanese: 
English:Microelectronics Reliability 
Volume, Number, Page Vol. 66        pp. 78-84
Published date Nov. 1, 2016 
Publisher
Japanese: 
English: 
Conference name
Japanese: 
English: 
Conference site
Japanese: 
English: 
DOI https://doi.org/10.1016/j.microrel.2016.09.018

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