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Publication Information
Title
Japanese:
English:
Evaluation and Modeling of Adhesion Layer in Shock-Protection Structure for MEMS Accelerometer
Author
Japanese:
山根 大輔
,
小西 敏文
,
佐布 晃昭
,
年吉 洋
,
曽根 正人
,
益 一哉
,
町田 克之
.
English:
Daisuke Yamane
,
Toshifumi Konishi
,
Teruaki Safu
,
Hiroshi Toshiyoshi
,
Masato Sone
,
Kazuya Masu
,
Katsuyuki Machida
.
Language
English
Journal/Book name
Japanese:
English:
Microelectronics Reliability
Volume, Number, Page
Vol. 66 pp. 78-84
Published date
Nov. 1, 2016
Publisher
Japanese:
English:
Conference name
Japanese:
English:
Conference site
Japanese:
English:
DOI
https://doi.org/10.1016/j.microrel.2016.09.018
©2007
Institute of Science Tokyo All rights reserved.