Nano-palpation AFM and its quantitative mechanical property mapping

Publication Information

Title

Japanese:	Nano-palpation AFM and its quantitative mechanical property mapping
English:	Nano-palpation AFM and its quantitative mechanical property mapping

Author

Japanese:	中嶋健, Ito, Makiko, Wang, Dong, Liu, Hao, Nguyen, Hung Kim, 梁暁斌, Kumagai, Akemi, Fujinami, So.
English:	Ken Nakajima, Ito, Makiko, Wang, Dong, Liu, Hao, Nguyen, Hung Kim, Xiaobin Liang, Kumagai, Akemi, Fujinami, So.

Language

English

Journal/Book name

Japanese:	Microscopy
English:	Microscopy

Volume, Number, Page

Vol. 63 No. 3 pp. 193-207

Published date

Apr. 25, 2014

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

Official URL

DOI