Radiation damage Analysis of High purity SiC by TEM

Publication Information

Title

Japanese:
English:	Radiation damage Analysis of High purity SiC by TEM

Author

Japanese:	Mohd Idzat bin Idris, 吉田克己, 矢野豊彦.
English:	Mohd Idzat Idris, Katsumi Yoshida, Toyohiko Yano.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

# 1H13

Published date

Mar. 26, 2016

Publisher

Japanese:
English:

Conference name

Japanese:	日本原子力学会2016年春の年会
English:	2016 Annual Meeting of the Atomic Energy Society of Japan

Conference site

Japanese:	仙台
English:	Sendai