Carrier lifetime measurement in a microcrystalline silicon wire waveguide

Publication Information

Title

Japanese:
English:	Carrier lifetime measurement in a microcrystalline silicon wire waveguide

Author

Japanese:	前川佑一, 武井亮平, 庄司雄哉, 水本哲弥, 亀井利浩.
English:	Y. Maekawa, Ryouhei Takei, Y. Shoji, T. Mizumoto, T. Kamei.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

MD3.2

Published date

Oct. 2, 2016

Publisher

Japanese:
English:

Conference name

Japanese:
English:	IEEE Photonics Conference (IPC 2016)

Conference site

Japanese:
English:	Waikoloa