Observation of Interface Defects in Diamond Lateral p-n-Junction Diodes and Their Effect on Reverse Leakage Current

Publication Information

Title

Japanese:
English:	Observation of Interface Defects in Diamond Lateral p-n-Junction Diodes and Their Effect on Reverse Leakage Current

Author

Japanese:	岩崎孝之, 諏訪泰介, 矢板潤也, Hiromitsu Kato, Toshiharu Makino, Masahiko Ogura, Daisuke Takeuchi, Satoshi Yamasaki, 波多野睦子.
English:	Takayuki Iwasaki, Taisuke Suwa, Junya Yaita, Hiromitsu Kato, Toshiharu Makino, Masahiko Ogura, Daisuke Takeuchi, Satoshi Yamasaki, Mutsuko Hatano.

Language

English

Journal/Book name

Japanese:
English:	IEEE TRANSACTIONS ON ELECTRON DEVICES

Volume, Number, Page

Vol. 64 No. 8 pp. 3298-3302

Published date

July 6, 2017

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

DOI